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Fig. 5 | International Journal of Implant Dentistry

Fig. 5

From: Influence of exposure of customized dental implant abutments to different cleaning procedures: an in vitro study using AI-assisted SEM/EDS analysis

Fig. 5

Examples of the elemental composition of the different contaminants and the background composition (zirconia) with Phenom ProX–SEM–EDS; measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E, F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2

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